The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

Nov. 27, 2018
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Mustafa Emin Sahin, Winnetka, CA (US);

Roberto Rimini, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/04 (2006.01); H01Q 3/28 (2006.01); H01Q 3/34 (2006.01); G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01S 13/04 (2013.01); G01S 13/90 (2013.01); H01Q 3/28 (2013.01); H01Q 3/34 (2013.01);
Abstract

Certain embodiments are directed to techniques (e.g., a device, a method, a memory or non-transitory computer readable medium storing code or instructions executable by one or more processors) for object detection and three-dimensional reconstruction of objects using coordinated beam scanning. The disclosed techniques teach coordinated beam scanning that can be used for both detecting proximity to personnel in addition to detecting objects for three-dimensional object reconstructions. The techniques form one or more millimeter wave beam that can be electronically steered by adjusting the phase of the various antenna elements. The techniques can include saving the plurality of grid points for which the object is detected to a memory for detecting a range to the object for Maximum Permitted Exposure (MPE) limit monitoring and three-dimensional object reconstruction.


Find Patent Forward Citations

Sahin, Mustafa. (2021). Apparatus and techniques for 3d reconstruction with coordinated beam scan using millimeter wave radar (U.S. Patent No. 11194031). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11194031

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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