The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

May. 29, 2018
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Korbinian Pfaffeneder, Munich, DE;

Georg Schnattinger, Dorfen, DE;

Marcel Thraenhardt, Freising, DE;

Michael Katzer, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/30 (2006.01); H04B 17/10 (2015.01); G01R 31/28 (2006.01); G01R 29/10 (2006.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
G01R 27/30 (2013.01); G01R 29/10 (2013.01); G01R 31/2822 (2013.01); H04B 17/0085 (2013.01); H04B 17/101 (2015.01);
Abstract

A system for vector network analysis of a device under test, comprising at least two measurement receivers, at least one signal generator device formed separately from the at least two measurement receivers, and at least one data processing unit connected with the measurement receivers. The connection between the data processing unit and at least one of the measurement receivers is flexible so that the position of the measurement receiver is adjustable. Further, a method for vector network analysis of a device under test is described.


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