logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11193964 B1

PDFFull Text
Date of Patent:
Dec. 07, 2021

Filed:

Jun. 04, 2019

System and method for measuring changes in dielectric properties in a structure

Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Abhijeet Dhiman, West Lafayette, IN (US);

Vikas Tomar, West Lafayette, IN (US);

Animesh Sharma, West Lafayette, IN (US);

Alexey Shashurin, West Lafayette, IN (US);

Sergey O Macheret, West Lafayette, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:

Piroozi-IP, LLC

Primary Examiner:

Farhana A Hoque

Assistant Examiner:

Joseph O Nyamogo

Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01L 1/10 (2006.01); G01K 11/26 (2006.01); G01L 1/12 (2006.01); G01K 1/024 (2021.01); G01K 7/32 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2635 (2013.01); G01K 1/024 (2013.01); G01K 7/32 (2013.01); G01K 11/26 (2013.01); G01L 1/10 (2013.01); G01L 1/12 (2013.01);
Abstract

A method of determining stress within a composite structure is provided which includes coupling a sensor to a composite structure under load having embedded therein a plurality of particles, wherein the particles at room temperature are paraelectric or ferroelectric, transmitting an electromagnetic radiation to the sensor, thereby generating an electromagnetic field into the composite structure, sweeping frequency from a first frequency to a second frequency in a pulsed manner, receiving reflected power from the composite structure, determining the resonance frequency of the sensor, and translating the resonance frequency of the sensor to stress within the composite structure.

Find Patent Forward Citations

Dhiman, Abhijeet. (2021). System and method for measuring changes in dielectric properties in a structure (U.S. Patent No. 11193964). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11193964

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…