The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

Oct. 17, 2017
Applicant:

Endress+hauser Flowtec Ag, Reinach, CH;

Inventors:

Rebecca Page, Basel, CH;

Peter Huggenberger, Dornach, CH;

Stefan Wiesmeier, Munich, DE;

Daniel Waldmann, Aesch, CH;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/18 (2006.01); G06N 3/08 (2006.01); G05B 13/02 (2006.01); G16H 20/10 (2018.01);
U.S. Cl.
CPC ...
G01N 33/18 (2013.01); G05B 13/027 (2013.01); G06N 3/088 (2013.01); G16H 20/10 (2018.01);
Abstract

A method for automated in-line detection of deviations of an actual state of a fluid from a reference state is disclosed wherein measured values captured at the same time are evaluated in a combined manner with respect to at least three measurement variables that are different measurement quantities of the fluid and/or a measurement quantity of the fluid measured at different measuring points. The method includes creating a reference data set, wherein reference measured values are mapped to a reference vector of a vector space using a neural network; in-line measurement, wherein measured values at all times are mapped to a measurement vector using the neural network; comparing the measurement vector with the reference vectors using a kernel density estimator of a predefinable window width; and creating an assessment with respect to a deviation of the actual state from the reference state on the basis of the kernel density estimator.


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