The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Sep. 15, 2017
Wuhan Joule Yacht Science & Technology Co., Ltd., Hubei, CN;
Xiangshui Miao, Hubei, CN;
Hao Tong, Hubei, CN;
Kaizhan Wang, Hubei, CN;
Yuanbing Wang, Hubei, CN;
Lingjun Zhou, Hubei, CN;
Yingrui Cai, Hubei, CN;
WUHAN JOULE YACHT SCIENCE & TECHNOLOGY CO., LTD., Hubei, CN;
Abstract
The disclosure provides a method for measuring the transverse thermal conductivity of a thin film. The method comprises the steps of measuring the longitudinal thermal conductivity of a thin film to be measured by using a 3ω method and by taking a second metal strip deposited on the surface of the thin film to be measured as a heating source at first; measuring the temperature rise of the thin film to be measured in the longitudinal direction by using the 3ω method, and deducing the thermal power of the thin film to be measured in the longitudinal direction; and finally, calculating the transverse thermal conductivity of the thin film to be measured. By adopting a 'substrate/thin film to be measured/metal strip' sample structure, the process difficulty of preparing a suspension structure sample can be effectively avoided.