The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Jun. 01, 2020
American Science and Engineering, Inc., Billerica, MA (US);
Jeffrey R. Schubert, Somerville, MA (US);
American Science and Engineering, Inc., Billerica, MA (US);
Abstract
An X-ray inspection system for scanning objects and providing corresponding contrast controlled scan images is provided. The system includes an X-ray source configured to generate an X-ray beam for irradiating the object where the X-ray source is coupled with at least a first beam filter having a first thickness and a second beam filter having a second thickness greater than the first thickness, a detector array, a processing unit, a user interface configured to receive a user input indicative of a desired level of contrast in an image, and a controller configured to adjust a position of at least one of the first or second beam filters based on the user input indicative of the desired level of contrast in the at least one image.