The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Jan. 30, 2019
Helmholtz Zentrum München Deutsches Forschungszentrum Für Gesundheit Und Umwelt (Gmbh), Neuherberg, DE;
Vasilis Ntziachristos, Munich, DE;
Miguel Angel Pleitez Rafael, Munich, DE;
Abstract
The invention relates to a device () and a corresponding method for mid-infrared microscopy and/or analysis, the device () comprising at least one radiation unit () configured to generate radiation () of time-varying intensity, the radiation () comprising one or more wavelengths in the mid-infrared spectral range, at least one refractive and/or reflective optical unit () which is configured to focus and/or direct the radiation () to at least one region or point of interest () located on and/or with-in an object (), at least one detection unit () configured to detect ultrasound waves () emitted by the object () at the at least one region or point of interest () in response to an interaction of the radiation () with the object () and to generate according detection signals, and an evaluation unit () configured to derive infor-mation regarding at least one property of the object () from the detection signals and/or to generate a spatial and/or spatio-temporal distribution of the detection sig-nals or of information derived from the detection signals obtained for the at least one region or point of interest () located on and/or within the object ().