The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

Jul. 02, 2019
Applicant:

The Research Foundation for the State University of New York, Albany, NY (US);

Inventors:

Anatoly Frenkel, Great Neck, NY (US);

Janis Timosenko, Upton, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G06N 20/00 (2019.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3103 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01);
Abstract

A method of supervised machine learning-based spectrum analysis information, using a neural network trained with spectrum information, to identify a specified feature of a given material, a system for supervised machine learning-based spectrum analysis, and a method of training a neural network to analyze spectrum data. The method of supervised machine learning-base spectrum analysis comprises inputting into the neural network spectrum data obtained from a sample of the given material; and the neural network processing the spectrum data, in accordance with the training of the neural network, and outputting one or more values for the specified feature of the sample of the material. In an embodiment, the training set of data includes x-ray absorption spectroscopy data for the given material. In an embodiment, the training set of data includes electron energy loss spectra (EELS) data.


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