The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Jul. 20, 2020
Applicant:
Purdue Research Foundation, West Lafayette, IN (US);
Inventors:
Amr Mohammad E Shaltout, West Lafayette, IN (US);
Alexander V. Kildishev, West Lafayette, IN (US);
Vladimir M Shalaev, West Lafayette, IN (US);
Jingjing Liu, West Lafayette, IN (US);
Assignee:
Purdue Research Foundation, West Lafayette, IN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/447 (2006.01); G01J 3/02 (2006.01); G01N 21/19 (2006.01); G02B 1/00 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/447 (2013.01); G01J 3/0224 (2013.01); G01J 3/0256 (2013.01); G01J 3/2803 (2013.01); G01N 21/19 (2013.01); G02B 1/002 (2013.01);
Abstract
A circular dichroism spectrometer which comprises a metasurface. The metasurface has a plurality of anisotropic antennas configured to simultaneously spatially separate LCP and RCP spectral components from an incoming light beam. An optical detector array is included which detects the LCP and RCP spectral components. A transparent medium is situated between the metasurface and the optical detector array.