The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Jan. 30, 2019
Analog Devices Global Unlimited Company, Hamilton, BM;
Claire Croke, Aherla, IE;
Aine McCarthy, Carrigaline, IE;
Adrian Sherry, Raheen, IE;
Giovanni C. Dotta, Limerick, IE;
Dan O'Donovan, Limerick, IE;
Sean Wilson, Limerick, IE;
Mary McCarthy, Innishannon, IE;
Colin G. Lyden, Baltimore, IE;
Fiona Mary Treacy, Limerick, IE;
Michael Byrne, Limerick, IE;
Analog Devices International Unlimited Company, Limerick, IE;
Abstract
Various examples are directed to systems and methods for managing a sensor. A measurement system may receive, from a host device, a first register map describing a first configuration of a measurement system. The first configuration may be associated with a first sensor. The measurement system may compare the first register map to an error rule set indicating inconsistent register map arrangements. After comparing the first register map to the error rule set, the measurement system may configure a switch matrix of the measurement system to sample the first sensor according to the first configuration of the measurement system. The measurement system may receive a plurality of samples from a first sensor and generate first digital measurement data based at least in part on the plurality of samples.