The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Dec. 04, 2019
Guilherme Cardoso, San Marcos, CA (US);
Griffin Lemaster, Solana Beach, CA (US);
Carlos Valenzuela, Chula Vista, CA (US);
Guilherme Cardoso, San Marcos, CA (US);
Griffin Lemaster, Solana Beach, CA (US);
Carlos Valenzuela, Chula Vista, CA (US);
Creative Electron, Inc., San Marcos, CA (US);
Abstract
An automatic x-ray inspection system and method for inspecting objects, containing a cabinet, a path for an object to roll within the cabinet, from an entry point to an exit point, wherein the path utilizes gravity to alter the position and orientation of the object as it travels along the path, an x-ray imaging system to image the object along the path within the cabinet, wherein the x-ray imaging system has a field of view that captures views of the object along the object's travel, and a computer algorithm to determine a thickness of at least one of a shell and center of the object, wherein if a uniform thickness is determined, the object is tagged as passed or non-passed.