The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

Mar. 10, 2020
Applicant:

Ryohsuke Nishi, Kanagawa, JP;

Inventor:

Ryohsuke Nishi, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); B29C 64/386 (2017.01); B29C 64/20 (2017.01); G01B 11/25 (2006.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); B29C 64/20 (2017.08); B29C 64/386 (2017.08); G01B 11/25 (2013.01); G01B 11/2513 (2013.01); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12);
Abstract

A measurement device is configured to measure a three-dimensional shape of an object for measurement. The measurement device includes a projector, an imager, an identifier, and a calculator. The projector is configured to project a plurality of light lines onto the object for measurement. The imager is configured to capture an image of the object for measurement on which the plurality of light lines are projected. The identifier is configured to identify a projection condition of the light lines based on shaping information of the object for measurement. The calculator is configured to calculate a plurality of line shapes from the image captured by the imager, based on the projection condition.


Find Patent Forward Citations

Nishi, Ryohsuke. (2021). Measuring device and shaping device (U.S. Patent No. 11193758). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11193758

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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