The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Mar. 11, 2020
Biomerieux, Inc., Durham, NC (US);
Jack R. Hoffmann, Jr., St. Louis, MO (US);
Gregory R. Maes, Fenton, MO (US);
Jeffrey Edward Price, Wildwood, MO (US);
Jared Ian Bullock, St. Louis, MO (US);
Samuel B. Crandall, Troy, MO (US);
Jacky S. Yam, St. Louis, MO (US);
Christopher George Kocher, St. Louis, MO (US);
Walter J. Clynes, O'Fallon, MO (US);
bioMerieux, Inc., Durham, NC (US);
Abstract
Provided herein are an optical test platform and corresponding method of manufacturing the same. The test platform may include a shell defining a cavity for receiving a sample tube, a first aperture, and a second aperture. The first aperture and the second aperture of the shell may each be configured to optically couple the cavity with an exterior of the shell. The test platform may further include a first window and a second window embedded in the shell. The first window may seal a first aperture and the second window may seal a second aperture. The first window and second window may each permit the optical coupling of the cavity with the exterior of the shell. The first window and the second window may be optically coupled via the cavity, and the shell may prohibit optical coupling between the first window and the second window through the shell.