The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

Jul. 22, 2019
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventors:

Thomas Mahieu, Ypres, BE;

Bart M. A. Missotten, Herent, BE;

Assignee:

CNH Industrial America LLC, New Holland, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2006.01); A01D 41/12 (2006.01); A01F 12/58 (2006.01); A01F 7/06 (2006.01); A01F 12/28 (2006.01); A01F 12/44 (2006.01); A01F 12/46 (2006.01); G01N 9/36 (2006.01);
U.S. Cl.
CPC ...
A01D 41/1243 (2013.01); A01D 41/127 (2013.01); A01D 41/1271 (2013.01); A01F 7/06 (2013.01); A01F 12/28 (2013.01); A01F 12/446 (2013.01); A01F 12/46 (2013.01); A01F 12/58 (2013.01); G01N 9/36 (2013.01);
Abstract

A monitoring system for a combine harvester. The monitoring system includes a sensor configured to provide a measurement wave to a flow of crop residue on the harvester and to receive a response wave from the flow of crop residue. The monitoring system further includes a processor having an input terminal for receiving a response signal of the sensor representative of the response wave. The processor is configured to determine a crop parameter associated with the density of the flow of crop based on the response signal of the sensor. The processor further has an output terminal for outputting a density signal representing the crop parameter.


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