The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Nov. 07, 2019
Applicant:
National Yang Ming Chiao Tung University, Taipei, TW;
Inventors:
Jyh-Cheng Chen, Taipei, TW;
Suei-Ting Jhao, Taipei, TW;
Assignee:
NATIONAL YANG MING CHIAO TUNG UNIVERSITY, Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 7/136 (2017.01); G06T 7/62 (2017.01); G06T 7/60 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06K 9/4647 (2013.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G06T 7/62 (2017.01); G06T 2207/10116 (2013.01);
Abstract
The present invention relates to a process for evaluating the characteristics of the focal spot of an X-ray tube. This algorithm can be used to obtain the size of fuzzy zone and focal spot size in all directions, and the average value thereof can be automated to replace cumbersome manual operations and reduce human error. The algorithm can be used to automatically obtain the size of fuzzy zone and focal spot size in each direction, as well as their average value, thus replacing cumbersome manual operations and reducing personal error.