The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
May. 14, 2019
Matterport, Inc., Sunnyvale, CA (US);
Gary Bradski, Palo Alto, CA (US);
Ethan Rublee, Mountain View, CA (US);
Mona Fathollahi, Sunnyvale, CA (US);
Michael Tetelman, Los Gatos, CA (US);
Ian Meeder, Mountain View, CA (US);
Varsha Vivek, Seattle, WA (US);
William Nguyen, San Jose, CA (US);
Matterport, Inc., Sunnyvale, CA (US);
Abstract
Methods and systems regarding importance sampling for the modification of a training procedure used to train a segmentation network are disclosed herein. A disclosed method includes segmenting an image using a trainable directed graph to generate a segmentation, displaying the segmentation, receiving a first selection directed to the segmentation, and modifying a training procedure for the trainable directed graph using the first selection. In a more specific method, the training procedure alters a set of trainable values associated with the trainable directed graph based on a delta between the segmentation and a ground truth segmentation, the first selection is spatially indicative with respect to the segmentation, and the delta is calculated based on the first selection.