The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Nov. 15, 2019
Align Technology, Inc., San Jose, CA (US);
Paren Indravadan Shah, Santa Clara, CA (US);
Anatoliy Parpara, Moscow, RU;
Andrey Cherkas, Krasnoznamensk, RU;
Alexey Kalinichenko, Cary, NC (US);
Align Technology, Inc., San Jose, CA (US);
Abstract
Implementations describe systems and methods for machine based defect detection of three-dimensional (3D) printed objects. A method of one embodiment of the disclosure includes providing a first illumination of a 3D printed object using a first light source arrangement. A plurality of images of the 3D printed object are then generated using one or more imaging devices. Each image may depict a distinct region of the 3D printed object. The plurality of images may then be processed by a processing device using a machine learning model trained to identify one or more types of manufacturing defects of a 3D printing process. The machine learning model may provide a probability that an image contains a manufacturing defect. The processing device may then determine, without user input, whether the 3D printed object contains one or more manufacturing defects based on the results provided by the machine learning model.