The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Aug. 13, 2019
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Jung-Yi Lin, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for detecting defects in manufactured objects includes acquiring a high-resolution image of an object for test, dividing the image into a plurality of smaller sub-images and determining, by a first model, whether each of the small sub-images is similar to a preset template image. The test object is determined to be flawless, when each of the sub-images is found to be similar to a template image. When sub-images are not found sufficiently similar to template images, determining, by a second model, whether a defect is shown to exist within each sub-image, and if so the test object is declared defective. The longer application of the second model is only applied if testing for defects is not resolved by the application of the first model. An electronic device and a computer readable storage medium are also provided.