The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Jan. 29, 2020
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method includes generating image signals from which a two-dimensional image is generated. The method includes generating object image signals by capturing an examination object arranged in a space. The method includes generating overview image signals by capturing an overview of the space. The method includes receiving image information included in the generated object image signals and the generated overview image signals. The method includes combining a two-dimensional object image, generated from the object image signals, with a two-dimensional perspectively distorted overview image of the space, generated from the overview image signals, to form a two-dimensional output image. The method includes scaling the received image information with respect to an image size for forming the output image in a manner such that at least one dimension of the examination object captured both in the object image and in the overview image has a same size in the output image.