The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Aug. 22, 2019
Applicant:
Omron Corporation, Kyoto, JP;
Inventors:
Tomohiro Yabuuchi, Kyoto, JP;
Tomoyoshi Aizawa, Kyoto, JP;
Koichi Kinoshita, Kyoto, JP;
Tadashi Hyuga, Hirakata, JP;
Hatsumi Aoi, Kyotanabe, JP;
Mei Uetani, Uji, JP;
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06F 9/30 (2018.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4638 (2013.01); G06F 9/3005 (2013.01); G06K 9/00268 (2013.01); G06K 9/00295 (2013.01); G06K 9/00362 (2013.01); G06K 9/00624 (2013.01);
Abstract
An image analyzer repeatedly obtains a captured image including a subject to be detected, and detects, in the captured image, a first area likely to include the subject without a cover, detects, in the captured image, a second area likely to include the subject with a cover, and determines whether the subject is covered by the cover based on a detection result of the first area and a detection result of the second area and a determination result for the captured image obtained previously.