The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

May. 29, 2020
Applicant:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Inventors:

Abhilash Gururaja, Levittown, NY (US);

Christopher J. Fjellstad, Smithtown, NY (US);

Assignee:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/14 (2006.01); G07G 1/00 (2006.01); G01G 19/414 (2006.01); A47F 9/04 (2006.01);
U.S. Cl.
CPC ...
G06K 7/1439 (2013.01); A47F 9/046 (2013.01); G01G 19/4144 (2013.01); G07G 1/0054 (2013.01);
Abstract

Methods of detecting scan avoidance events are disclosed herein. An example method includes measuring, by a weighing scale associated with a barcode reader, an unstable weight over a timeframe having a duration that is greater than a threshold duration. The method further includes monitoring for (i) the barcode reader's failure, during the first timeframe, to transition from a first state in which an imager of the barcode reader does not transmit images for decoding to a second state in which the imager captures images over an FOV including a product scanning region and transmits the captured images for decoding; or (ii) the barcode reader's failure to decode a barcode from images captured over the FOV including the product scanning region during the first timeframe; and generating an alert indicating a potential scan avoidance event responsive to both the measured unstable weight over the timeframe and one of (i) or (ii).


Find Patent Forward Citations

Loading…