The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Jul. 21, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yuko Yamashita, Tokyo, JP;

Tsuyoshi Minakawa, Tokyo, JP;

Tomoe Tomiyama, Tokyo, JP;

Kenji Kawasaki, Tokyo, JP;

Hidenori Yamamoto, Tokyo, JP;

Takeshi Handa, Tokyo, JP;

Takashi Tsuno, Tokyo, JP;

Hiroyuki Hirata, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 16/242 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 11/301 (2013.01); G06F 11/3476 (2013.01); G06F 16/2423 (2019.01); G06F 16/288 (2019.01);
Abstract

A data analysis support apparatus includes a relationship network generation section that analyzes a relationship between operating systems, a relationship between operation data tables, a relationship between data items possessed by the operation data tables and a relationship between data values possessed by records of the operation data tables and stores them, as a relationship network; a data item classification section that classifies data items that become a data analysis target into a first data type based on an actual value and a second data type based on a planned value; an analysis data table generation section that generates and accumulates an analysis data table to be used for data analysis; a data model generation section that generates, as a data model, a data item group that allows data analysis in combination; and an analysis target item presentation section that recommends a data item to be made an analysis target.


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