The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Jan. 05, 2021
Applicant:

Tableau Software, Inc., Seattle, WA (US);

Inventors:

William Pugh, Seattle, WA (US);

Mengxi Chen, Seattle, WA (US);

Isaac Kunen, Seattle, WA (US);

Assignee:

TABLEAU SOFTWARE, INC., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2455 (2019.01); G06F 16/25 (2019.01); G06F 16/2453 (2019.01); G06F 16/248 (2019.01);
U.S. Cl.
CPC ...
G06F 16/258 (2019.01); G06F 16/248 (2019.01); G06F 16/2453 (2019.01); G06F 16/2455 (2019.01);
Abstract

A user interface includes a data flow pane and a profile pane. The data flow pane displays a flow diagram that identifies a data source. For each of multiple queries against the data source, the process issues the query against the data source asynchronously with a block size. Upon retrieval of the initial set of rows, the process repeats the query asynchronously until all of the rows have been retrieved. Periodically the process determines a high water mark for rows from the data source that have been retrieved for all of the queries. When the water mark changes, the process updates the profile pane to display statistical distributions of data values for multiple data fields in the data source. Each distribution element in each statistical distribution counts the rows below the water mark that have a single specific data value or range of data values.


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