The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Oct. 31, 2016
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Thomas Allan Haggie, Vancouver, CA;

Clint Sharp, Oakland, CA (US);

Alexander Douglas James, Sammamish, WA (US);

David Ryan Marquardt, San Francisco, CA (US);

Hailun Yan, Sunnyvale, CA (US);

Christopher Pride, San Francisco, CA (US);

Vishal Patel, San Francisco, CA (US);

Amrittpal Singh Bath, San Francisco, CA (US);

Pratiksha Shah, Fremont, CA (US);

Murugan Kandaswamy, Sunnyvale, CA (US);

Steve Yu Zhang, San Francisco, CA (US);

Ledion Bitincka, San Francisco, CA (US);

David E. Simmen, Mountain view, CA (US);

Marc Andre Chene, Bellevue, WA (US);

Esguerra Ma Kharisma, San Mateo, CA (US);

Igor Stojanovski, San Francisco, CA (US);

Assignee:

SPLUNK INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/248 (2019.01); G06F 16/22 (2019.01); G06F 16/25 (2019.01); G06F 16/28 (2019.01); G06F 16/901 (2019.01); G06F 16/951 (2019.01); G06F 16/242 (2019.01); G06F 16/2455 (2019.01); G06F 16/2458 (2019.01); G06F 16/835 (2019.01); G06F 16/9038 (2019.01); G06F 16/9535 (2019.01); G06F 16/903 (2019.01); H04L 29/08 (2006.01); G06F 3/0481 (2013.01); G06T 11/20 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 16/248 (2019.01); G06F 3/0481 (2013.01); G06F 16/22 (2019.01); G06F 16/2228 (2019.01); G06F 16/2255 (2019.01); G06F 16/2425 (2019.01); G06F 16/2455 (2019.01); G06F 16/2462 (2019.01); G06F 16/2477 (2019.01); G06F 16/24568 (2019.01); G06F 16/25 (2019.01); G06F 16/285 (2019.01); G06F 16/8373 (2019.01); G06F 16/901 (2019.01); G06F 16/9038 (2019.01); G06F 16/90335 (2019.01); G06F 16/951 (2019.01); G06F 16/9535 (2019.01); G06T 11/206 (2013.01); H04L 67/02 (2013.01); H04L 67/025 (2013.01); G06T 2200/24 (2013.01); H04L 43/08 (2013.01);
Abstract

The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting each metric including at least one key value and a measured value taken of a computing resource, and storing each metric in an index of a metrics store, where the index defines at least one dimension populated with the at least one key value and a measure populated with the measured value. The method further includes cataloging metadata in a metrics catalog, where the metadata is related to the metrics stored in the metrics store, performing an analysis of metrics data included in the metrics store and/or the metrics catalog to obtain results, and causing display of the results or an indication of the results on a display device.


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