The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Dec. 27, 2018
Applicant:

Teradata Us, Inc., Dayton, OH (US);

Inventors:

Paul Sinclair, Manhattan Beach, CA (US);

Sung Jin Kim, Bueno Park, CA (US);

Srikanth Reddy Muthyala, Dayton, OH (US);

Samrat Pandiri, Dayton, OH (US);

Assignee:

Teradata US, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2455 (2019.01); G06F 16/248 (2019.01); G06F 16/242 (2019.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24552 (2019.01); G06F 16/242 (2019.01); G06F 16/248 (2019.01); G06F 16/24542 (2019.01);
Abstract

A first query execution plan generated for a query on a second time the query was processed by a database is compared against a dynamically generated second query plan generated based on statistics only dynamic feedback for the second time the query is processed by the database. A determination is made on the second time as to whether to cache the first query execution plan, the second query execution plan, or no plan for third or more times the query is processed by the database. The query can be non-parameterized or parameterized.


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