The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Dec. 15, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Kevin Minerley, Red Hook, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Daniel Nicolas Gisolfi, Hopewell Junction, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A system and related method comprise using a processor for executing a plurality of tests associated with a covering array of a test framework of the software test system on a first version of a system under test (SUT). For each of the plurality of tests, on a current test, the method comprises determining a current success rate value (SRV) for the current test that represents a success rate of the current test for the first version of the SUT. The method further comprises combining the current SRV of the first version of the SUT and current SRVs of the current test for prior versions of the SUT into a current test eigenvector associated with the current test. The method further comprises converting the current test eigenvector into a first eigenvalue that represents a health, accuracy, and quality of the first version of the SUT.