The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Apr. 13, 2018
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Aditya Gopisetti, Bangalore, IN;

Chandrashekhar Jha, Bangalore, IN;

Jobin Raju George, Bangalore, IN;

Kumar Gaurav, Bangalore, IN;

Jusvinder Singh, Bangalore, IN;

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2018.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3423 (2013.01); G06F 9/45558 (2013.01); G06F 11/301 (2013.01); G06F 2009/45591 (2013.01);
Abstract

The detection of idle virtual machines through usage pattern analysis is described. In one example, a computing device can collect utilization metrics from a virtual machine over time. The utilization metrics can be related to one or more processing usage, disk usage, network usage, and memory usage metrics, among others. The utilization metrics can be separated into a set of training metrics and a set of validation metrics, and a number of clusters can be determined based on the set of training metrics. The clusters can be used to organize the set of validation metrics into groups. Depending upon the number or overall percentage of the utilization metrics assigned to individual ones of the plurality of clusters, it is possible to determine whether or not the virtual machine is an idle virtual machine. Once identified, idle virtual machines can be shut down to conserve processing resources and costs.


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