The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Jul. 12, 2019
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Thierry Supplisson, Cork, IE;
Eric Thiebaut-George, Cork, IE;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/20 (2006.01); G06F 11/30 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01); G06F 11/2069 (2013.01); G06F 11/3034 (2013.01); H04L 41/069 (2013.01); H04L 41/0622 (2013.01); H05K 999/99 (2013.01);
Abstract
A method and technique for data lifecycle management includes identifying a fault from a monitored system. A time period window is defined associated with the fault based on a time the fault occurred. One or more metrics that are related to the fault that fall within the time period window are identified from the monitored system and stored in a memory. A lifespan is assigned to the one or more metrics based on the fault, and the one or more metrics are removed from the memory when their associated lifespans are over.