The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Mar. 19, 2020
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Vasileios Vonikakis, Singapore, SG;
Yao Zhou, Singapore, SG;
Chandra Suwandi Wijaya, Singapore, SG;
Ariel Beck, Singapore, SG;
Abstract
A method implemented in a computing-device with a display screen for image inspection. The method comprises displaying a distribution of a quality-indicia of at least one object in each of a plurality of images to be inspected, within a first area of the display screen. Within a second area of the display screen, a user-control is displayed to adjust a threshold-value with respect to an acceptance of at least one object in said plurality of images to be inspected. The threshold-value may be determined manually or automatically. A change in or update of threshold value is determined based on a user-operation performed over the user-control for adjusting the threshold value. Thereafter, a quality-indicia of at least one object in each the plurality of images is determined. Acceptable objects in respect of an image inspection procedure based on the updated threshold value and the determined quality-indicia are indicated.