The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Mar. 08, 2018
Applicant:

Ricoh Company, Ltd., Tokyo, JP;

Inventors:

Masayuki Fujishima, Kanagawa, JP;

Hidetaka Noguchi, Hyogo, JP;

Hidenori Kato, Hyogo, JP;

Masashi Suematsu, Hyogo, JP;

Junichi Azumi, Miyagi, JP;

Shuichi Suzuki, Osaka, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G01J 3/18 (2006.01); G02B 26/00 (2006.01);
U.S. Cl.
CPC ...
G02B 26/0808 (2013.01); G01J 3/18 (2013.01); G02B 26/007 (2013.01); G02B 26/0858 (2013.01); G02B 26/0866 (2013.01);
Abstract

A movable diffraction element and a spectroscope. The movable diffraction element includes a movable component having a comb-like shape, a supporting unit configured to support the movable component, a first cantilever actuator coupled to the supporting unit, a displacement determiner coupled to an edge of the first cantilever actuator, and a second cantilever actuator disposed parallel to the first cantilever actuator. In the movable diffraction element, a slope generated when the second cantilever actuator deforms is approximately equivalent to a slope generated at the first cantilever actuator. The spectroscope includes the movable diffraction element.


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