The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Jun. 19, 2019
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Debra J. Tonks, Andover, MA (US);
Stephen M. Sparagna, Milton, MA (US);
William Kennedy, Boston, MA (US);
David A. Ringheiser, Carlisle, MA (US);
Jack Lee, Sudbury, MA (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01S 13/02 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4004 (2013.01); G01S 7/4008 (2013.01); G01S 7/4021 (2013.01); G01S 2013/0245 (2013.01);
Abstract
An apparatus and method for enhanced calibration of radar at the module level supports dual polarization and array calibration and alignment without the use of external test equipment. Utilizing a delay line, loop back capability at the module level allows existing receiver exciter subsystem to be used for calibration. This approach eliminates the need for manual array calibration using external RF monitor subsystem or external test antennas.