The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
May. 24, 2017
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Lei Chen, Beijing, CN;
HEFEI XINSHENG OPTOELECTRONICS, Hefei, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
Embodiments of the disclosure provide a method for calibrating a current measurement device, a current measurement method and device, and a display device. The method for calibrating a current measurement device includes: inputting a plurality of given currents to the current measurement device; detecting a plurality of time parameters corresponding to the plurality of given currents; establishing the functional relationship between the current and the time parameter based on the plurality of given currents and the corresponding plurality of time parameters. According to the embodiments of the disclosure, the precision of the current measurement is improved.