The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Sep. 18, 2018
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Arul Manickam, Mount Laurel, NJ (US);

Stephen M. Alessandrini, Medford, NJ (US);

Gregory Scott Bruce, Abington, PA (US);

Peter G. Kaup, Marlton, NJ (US);

Assignee:

LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/26 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/26 (2013.01); G01R 33/0029 (2013.01);
Abstract

The present disclosure relates to apparatuses and methods for stimulating a magneto-optical defect material with defect centers in a magnetic detection system using a stimulation process to significantly increase magnetic sensitivity of the detection system. The system utilizes a Ramsey pulse sequence pair or a shifted magnetometry adapted cancellation (SMAC) pair to detect and measure the magnetic field acting on the system. Utilizing a pair of magnetic measurements that are approximately in quadrature improves the dynamic range and accuracy of the magnetic detection.


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