The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Feb. 27, 2017
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Hirotada Teranishi, Osaka, JP;

Takahiro Sakai, Shiga, JP;

Makoto Kondo, Shiga, JP;

Naoyuki Kimura, Okayama, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); H01R 13/24 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06722 (2013.01); G01R 1/06738 (2013.01); H01R 13/2421 (2013.01);
Abstract

A probe pin includes a coil spring extending and contracting along a center line, a first contact disposed on one side of the center line and having a rectangular cross section, and a second contact disposed on the other side of the center line and having a rectangular cross section. The first contact and the second contact are supported so as to be reciprocable via the spring coil and are electrically connected to each other. In particular, a contact surface of at least one of the first contact and the second contact is an inclined surface inclined so as to descend along a thickness direction.


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