The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Mar. 19, 2019
Jfe Steel Corporation, Tokyo, JP;
Naoshi Yamahira, Tokyo, JP;
Toshiki Tsuboi, Tokyo, JP;
JFE STEEL CORPORATION, Tokyo, JP;
Abstract
A particle size distribution measurement apparatus includes a coarse grain measurement device that acquires information indicating distribution of coarse grains, an adherent powder measurement device that acquires information indicating distribution of adherent powder, and a computation device that calculates distribution of a raw material. The computation device includes a coarse grain particle size distribution calculation unit configured to calculate the distribution of the coarse grains on the basis of the information acquired by the coarse grain measurement device, an adherent powder particle size distribution calculation unit configured to calculate the particle size distribution of the adherent powder on the basis of the information acquired by the adherent powder measurement device, and a raw material particle size distribution calculation unit configured to calculate the particle size distribution of the raw material on the basis of the distribution calculated by the coarse grain and adherent powder particle size distribution calculation units.