The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Apr. 12, 2018
Captl Llc, West Lafayette, IN (US);
Masanobu Yamamoto, West Lafayette, IN (US);
Keegan Hernandez, Crown Point, IN (US);
J. Paul Robinson, West Lafayette, IN (US);
CAPTL LLC, West Lafayette, IN (US);
Abstract
A measurement system includes an optical source (e.g., laser) to irradiate a sample (e.g., a cell); a solid-state photon detector (SSPD) to receive resultant light from the sample; and a photon counter to count photons received by the SSPD. The photon counter can include a differentiator to provide a differentiated photon signal and a crossing detector configured to count photons based on a number of times the differentiated photon signal crosses a predetermined threshold level. In some examples, a pulse detector can provide a pulse-width signal from the SSPD output photon signal, and a pulse counter can count based on both a number of pulses and widths of the pulses. The SSPD can include a silicon photomultiplier (SiPM) array or a solid-state photomultiplier. Some examples use the measurement system to measure samples in fluids, e.g., in flow cytometers or multi-well plates.