The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Jan. 16, 2020
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Wolfgang Hoegele, Rosenheim, DE;
Christian Hoerr, Flintsbach am Inn, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A measuring apparatus for determining object data of at least one test object includes at least one distribution of retroreflectors. The retroreflectors are arranged on the measuring apparatus. The distribution has at least so many retroreflectors that at least three retroreflectors are observable at at least three spatially different observation locations in at least 90% of all possible spatial orientations of the measuring apparatus. A distance range of the observation locations is 0.1 m to 30 m. Each of the retroreflectors has a maximum acceptance angle. Each of the retroreflectors has a diameter of 1 mm to 50 mm. The retroreflectors are arranged such that, for each of the observation locations, a minimum spacing of measured retroreflector distances of the observable retroreflectors is 0.1 mm to 50 mm.