The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Dec. 26, 2018
Applicant:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Inventor:
Shiveesh Fotedar, Sunnyvale, CA (US);
Assignee:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/00 (2006.01); G01K 7/00 (2006.01); G01K 13/00 (2021.01); A61J 1/05 (2006.01); G01K 1/02 (2021.01); G01K 1/14 (2021.01);
U.S. Cl.
CPC ...
A61J 1/05 (2013.01); G01K 1/026 (2013.01); G01K 1/14 (2013.01); G01K 13/00 (2013.01); A61J 2200/72 (2013.01);
Abstract
One embodiment provides an apparatus, comprising: a first flexible substrate with a plurality of slits and at least one sensor, wherein the slits are arranged around a center of the first flexible substrate, wherein the sensor is arranged between a pair of the slits, and wherein when an object is inserted into an orifice created by the slits, the sensor is configured to maintain contact with the object, thereby allowing a measurement of a characteristic of the object over a predetermined period of time.