The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Aug. 16, 2019
United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);
William T. Yost, Newport News, VA (US);
John H. Cantrell, Williamsburg, VA (US);
Daniel F. Perey, Yorktown, VA (US);
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA, Washington, DC (US);
Abstract
Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.