The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2021
Filed:
Aug. 14, 2019
Topcon Corporation, Tokyo, JP;
Makoto Saika, Nerima-ku, JP;
Tsutomu Kikawa, Adachi-ku, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
An ophthalmologic apparatus includes an OCT measurement unit, a corneal shape measurement unit, an eyeball model generator, and a site specifying unit. The OCT measurement unit is configured to acquire data of a subject's eye by deflecting measurement light using an optical scanner to project onto the subject's eye and detecting interference light between returning light of the measurement light from the subject's eye and reference light. The corneal shape measurement unit is configured to obtain curvature radius distribution on a cornea by detecting returning light of a measurement pattern projected onto a cornea of the subject's eye. The eyeball model generator is configured to generate an eyeball model using the curvature radius distribution on the cornea. The site specifying unit is configured to specify a traveling direction of the measurement light by performing ray tracing on the measurement light incident on each of a plurality of incident positions on the cornea based on a scan angle and the eyeball model, and to specify a position corresponding to an intraocular site of the subject's eye in the traveling direction based on the data acquired using the measurement light.