The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

May. 01, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jin-Kyung Lee, Suwon-si, KR;

Tae-Kyung Kim, Seoul, KR;

Taek-Seong Jeong, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/271 (2018.01); H04N 13/246 (2018.01); G06T 7/571 (2017.01); G06T 7/593 (2017.01); H04N 13/239 (2018.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 13/271 (2018.05); G06T 7/571 (2017.01); G06T 7/593 (2017.01); H04N 5/23212 (2013.01); H04N 13/239 (2018.05); H04N 13/246 (2018.05); G06T 2207/10021 (2013.01); G06T 2207/10028 (2013.01);
Abstract

An example camera and a method for extracting depth information by the camera having a first lens and a second lens are provided. The method includes photographing, by the first lens, a first image; photographing, by the second lens, a second image of a same scene; down-sampling the first image to a resolution of the second image if the first image is an image having a higher resolution than a resolution of the second image; correcting the down-sampled first image to match the down-sampled first image to the second image; and extracting the depth information from the corrected down-sampled first image and the second image.


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