The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Feb. 21, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
An error rate test method is disclosed. The error rate test method comprises the following steps. At least one test signal with a predetermined frequency is received from at least one device under test. A symbol sequence comprised in the at least one test signal is determined. At least one error quantity being associated with the at least one device under test and the at least one test signal is determined based on the determined symbol sequence, wherein the at least one error quantity determined is indicative of a rate of erroneous symbols comprised in the symbol sequence. Respective error quantities are determined simultaneously for at least one of multiple devices under test and for multiple different predetermined frequencies. Further, a test system for testing a device under test is disclosed.