The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Feb. 08, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Gerald Schermann, Yorktown Heights, NY (US);

Fabio A. Oliveira, Yorktown Heights, NY (US);

John Erik Wittern, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 41/12 (2013.01); H04L 41/0816 (2013.01); H04L 41/0853 (2013.01); H04L 41/22 (2013.01); H04L 67/16 (2013.01);
Abstract

A method and system of determining a health state of a microservice based application includes extracting traces of multiple variants of a microservice-based application. Topologies of the multiple variants are inferred based on the extracted traces. One or more topological differences of each of the multiple variants are identified based on the extracted traces. Each topological difference is ranked. The topological differences of the microservice-based application are displayed on a user interface, including a microservice map of the topological differences and a listing of a top ranking of the topological differences.


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