The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Nov. 11, 2019
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Amit Kumar Aggarwal, Gurugram, IN;

Rahul Sekhri, Ambala, IN;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0681 (2013.01); H04L 41/16 (2013.01); H04L 43/16 (2013.01);
Abstract

Systems and methods include obtaining measured data associated with one or more parameters associated with operation of a network element in a network, wherein the measured data is over a learning window; analyzing the measured data to statistically determine thresholds for the one or more parameters; and configuring the network element with the determined thresholds for the one or more parameters, wherein the network element is configured to compare ongoing measurements of the one or more parameters with the determined thresholds, and to use any threshold crossings for any of alarming and actions on the network element. The systems and methods can further include, subsequent to a predetermined time period after the configuring, recalibrating the thresholds for the one or more parameters based on updated measured data and reconfiguring the network element with the recalibrated thresholds for the one or more parameters.


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