The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Jun. 12, 2020
Applicant:

Stichting Imec Nederland, Eindhoven, NL;

Inventor:

Jac Romme, Schiedam, NL;

Assignee:

Stichting IMEC Nederland, Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/7156 (2011.01); G01S 13/84 (2006.01);
U.S. Cl.
CPC ...
H04B 1/7156 (2013.01); G01S 13/84 (2013.01);
Abstract

A measuring system includes a first measuring device and a second measuring device. The measuring system is configured to, between the first measuring device and the second measuring device, determine a first phase shift at a first frequency, determine a second phase shift at a second frequency, and determine a third phase shift at a third frequency. The first measuring device includes a phase difference calculator configured to calculate a first phase difference between the first phase shift and the second phase shift, and a second phase difference between the second phase shift and the third phase shift. The first measuring device also includes a range/velocity calculator configured to determine a first biased distance estimate from the first phase difference, a second biased distance estimate from the second phase difference, and an unbiased distance and/or velocity from the first biased distance estimate and the second biased distance estimate.


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