The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Apr. 18, 2018
Applicant:

(Cnbm) Bengbu Design & Research Institute for Glass Industry, Bengbu, CN;

Inventors:

Helmut Vogt, Munich, DE;

Robert Lechner, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0463 (2014.01); H01L 31/046 (2014.01); H01L 31/18 (2006.01); H01L 21/66 (2006.01); G01N 23/2209 (2018.01);
U.S. Cl.
CPC ...
H01L 31/0463 (2014.12); H01L 22/12 (2013.01); H01L 31/046 (2014.12); H01L 31/18 (2013.01); G01N 23/2209 (2018.02); G01N 2223/611 (2013.01); G01N 2223/645 (2013.01);
Abstract

A method for producing a layer structure for the production of thin-film solar cells including: providing a carrier substrate, depositing a rear electrode layer on the carrier substrate, producing a rear-electrode-layer-free region, creating a measurement layer over the rear electrode layer such that the measurement layer is situated at least over the rear-electrode-layer-free region, wherein the measurement layer is a photoactive absorber layer or a precursor layer of the photoactive absorber layer, and determining a quantity or a relative share of a component of the measurement layer in a region of the measurement layer that is situated over the rear-electrode-layer-free region of the rear electrode layer.


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