The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Oct. 17, 2019
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventor:

Nao Nagata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/40 (2006.01); H01L 29/06 (2006.01); H01L 29/10 (2006.01); H01L 21/765 (2006.01); H01L 29/66 (2006.01); H01L 21/265 (2006.01); H01L 21/324 (2006.01); H01L 21/225 (2006.01); H01L 21/74 (2006.01); H01L 29/739 (2006.01);
U.S. Cl.
CPC ...
H01L 29/405 (2013.01); H01L 21/2253 (2013.01); H01L 21/26513 (2013.01); H01L 21/324 (2013.01); H01L 21/743 (2013.01); H01L 21/765 (2013.01); H01L 29/0696 (2013.01); H01L 29/1087 (2013.01); H01L 29/1095 (2013.01); H01L 29/407 (2013.01); H01L 29/66333 (2013.01); H01L 29/7395 (2013.01);
Abstract

A semiconductor device and a method of manufacturing a semiconductor device capable of suppressing breakdown due to current concentration while suppressing an increase in chip size are provided. According to one embodiment, a semiconductor device has a gate resistance on a main surface side of a semiconductor substrate, a first contact and a second contact connected to an upper surface of the gate resistance, and a carrier discharging portion that discharges the carrier formed in the semiconductor substrate below the gate resistance, the gate resistance having a first contacting portion to which a first contact is connected, a second contacting portion to which a second contact is connected, and a plurality of extending portions with one end connected to the first contacting portion and the other end connected to the second contacting portion. The gate resistance forms an opening between adjacent extending portions and the carrier discharge portion is formed in the opening.


Find Patent Forward Citations

Loading…