The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Aug. 01, 2019
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chih-Chen Chang, New Taipei, TW;

Yu-Wen Chi, Hsinchu County, TW;

Kun-Ping Huang, Miaoli County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32229 (2013.01); H01J 37/32247 (2013.01);
Abstract

Provided is a focalized microwave plasma reactor. The reactor utilizes a cylindrical microwave resonant cavity of the quasi-TMmode to focalize microwave power and to excite focalized microwave plasma for the processes of microwave plasma enhanced chemical vapour depositions.


Find Patent Forward Citations

Chang, Chih-Chen. (2021). Focalized microwave plasma reactor (U.S. Patent No. 11183369). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11183369

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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