The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Nov. 14, 2018
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventor:

Do Hyung Ryu, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 31/2825 (2013.01); G09G 3/035 (2020.08);
Abstract

A display device includes a display panel having a plurality of pixels and a driving circuit. A plurality of driving lines electrically connects the driving circuit to the display panel and supplies driving signals from the driving circuit to the display panel. A switching unit connects each of the plurality of driving lines to a first end of an inspection line. An inspection circuit is connected to a second end of the inspection line. A line selection unit is configured to selectively connect one or more of the plurality of driving lines to the inspection circuit through the inspection line.


Find Patent Forward Citations

Ryu, Do. (2021). Display device and crack inspection method thereof (U.S. Patent No. 11183089). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11183089

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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