The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Aug. 30, 2018
Sony Corporation, Tokyo, JP;
Suguru Aoki, Tokyo, JP;
Ryuta Satoh, Kanagawa, JP;
Atsushi Ito, Kanagawa, JP;
Hideki Oyaizu, Tokyo, JP;
Takeshi Uemori, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
Methods and apparatus for image processing are provided. The method comprises receiving input of a visible-ray image and a far-infrared-ray image obtained by photographing a same subject, estimating a blur estimation result in the visible-ray image, wherein estimating a blur estimation result comprises calculating a correlation between the visible-ray image and each of a plurality of filter-applied far-infrared ray images in which a different filter is applied to the far-infrared-ray image and selecting the filter for which the calculated correlation is highest, and performing a correction process on the visible-ray image based, at least in part, on the blur estimation result to generate a corrected visible-ray image from which the blur is reduced, wherein generating the corrected visible-ray image comprises applying, to the visible ray image, an inverse filter having an inverse characteristic to a characteristic of the selected filter.